rust-embedded / rust-embedded/embedded-hal-mock
Top level mock wrapper
Nobody has claimed this yet.
- Dominant language
- Rust
- Stars
- 146
- Forks
- 29
- PR merge metrics
- No merged PRs in 30d
Description
For driver testing it is sometimes useful to expect a series of operations across a variety of peripherals (for example, pins, SPI, delays).
I haven't yet worked out exactly how, some refactoring will be required, but I think we should be able to create a top level / generic mock over a set of peripherals, while using the individual peripheral code to evaluate each "transaction".
Contributor guide
First steps
- Read the whole issue, then the project's contributing guide.
- Comment on the issue to say you are picking it up — it saves two people doing the same work.
- Fork the repository and make your change on a branch.
- Open a pull request that references the issue number.
Research direction
The issue names no files, tests, or entry points. Start by reading the existing individual peripheral mock implementations and their tests to understand how transactions are evaluated. Done would mean a generic top-level mock can coordinate operations across peripherals such as pins, SPI, and delays, with coverage for the combined behavior.
Written by the indexing model from the issue text.
Assessment
- Tech stack
- rust
- Domain
- embedded-iot, testing-qa
- Issue type
- Feature
- Difficulty
- 5/5
- Estimated time
- Over a week
- Activity status
- Stale
- Clarity
- Needs clarification
- Newbie friendliness
- 20/100