[test] E2E bootstrap tests are failing/flaky
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Description
### Description
The following tests have become flaky/failing occasionally on `master`, some time around June 8th 2026:
- `//sw/device/silicon_creator/rom/e2e/bootstrap:e2e_bootstrap_disabled_fpga_cw340_rom_with_fake_keys`
- `//sw/device/silicon_creator/rom/e2e/rom_e2e_bootstrap_entry:e2e_bootstrap_entry_rma_fpga_cw340_rom_with_fake_keys`
These should be investigated and then fixed.
Contributor guide
First steps
- Read the whole issue, then the project's contributing guide.
- Comment on the issue to say you are picking it up — it saves two people doing the same work.
- Fork the repository and make your change on a branch.
- Open a pull request that references the issue number.
Research direction
Start by running the two named Bazel E2E targets under sw/device/silicon_creator/rom/e2e and sw/device/silicon_creator/rom/e2e/rom_e2e_bootstrap_entry, then inspect their failure logs and recent changes around June 8, 2026. Done means both bootstrap tests pass reliably on master and the flaky or failing condition is fixed.
Written by the indexing model from the issue text.
Assessment
- Domain
- embedded-iot, testing-qa
- Issue type
- Bug
- Difficulty
- 4/5
- Estimated time
- 3-5 days
- Activity status
- Quiet
- Clarity
- Needs clarification
- Newbie friendliness
- 35/100