lowRISC / lowRISC/opentitan

[multitop,dv] chip_sw_keymgr_dpe_key_derivation

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Component:ChipLevelTest IP:keymgr_dpe Priority:P1
Dominant language
SystemVerilog
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Forks
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Avg merge
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Merged PRs (30d)
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Description

The DV for this test must be ported from the integrated_dev to master. The device software has already been ported.

Contributor guide

Open the contributing guide

First steps

  1. Read the whole issue, then the project's contributing guide.
  2. Comment on the issue to say you are picking it up — it saves two people doing the same work.
  3. Fork the repository and make your change on a branch.
  4. Open a pull request that references the issue number.

Research direction

Start by locating the chip_sw_keymgr_dpe_key_derivation DV test in the integrated_dev and master branches, then compare the existing device-software port with the remaining DV work. Done means the DV test is ported to master and preserves the integrated_dev test coverage and behavior.

Written by the indexing model from the issue text.

Assessment

Domain
testing
Issue type
Refactor
Difficulty
4/5
Estimated time
3-5 days
Activity status
Stale
Clarity
Needs clarification
Newbie friendliness
35/100

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