[chip-test] chip_sw_alert_handler_ping_timeout
Nobody has claimed this yet.
- Dominant language
- SystemVerilog
- Stars
- 3.6k
- Forks
- 1.1k
- Avg merge
- 2d 22h
- Merged PRs (30d)
- 141
Description
### Test point name
[chip_sw_alert_handler_ping_timeout](https://github.com/lowRISC/opentitan/blob/3f65c2a534fc75ed43f3af438f01afc5232bfc2b/hw/top_earlgrey/data/ip/chip_alert_handler_testplan.hjson#L154-L166)
### Host side component
None
### OpenTitanTool infrastructure implemented
None
### Silicon Validation (SiVal)
Yes
### Emulation Targets
- [ ] None
- [X] CW310
- [x] Hyperdebug + CW310
### Contact person
@msfschaffner
### Checklist
Please fill out this checklist as items are completed. Link to PRs and issues as appropriate.
- [x] Check if existing test covers most or all of this testpoint (if so, either extend said test to cover all points, or skip the next 3 checkboxes)
- [x] Device-side (C) component developed
- [x] Bazel build rules developed
- [ ] Host-side component developed
- [x] HJSON test plan updated with test name (so it shows up in the dashboard)
- [x] Test added to dvsim nightly regression (and passing at time of checking)
- [x] For SiVal test cases, test is running relevant FPGA or silicon regression
> estimate 0.5
Contributor guide
First steps
- Read the whole issue, then the project's contributing guide.
- Comment on the issue to say you are picking it up — it saves two people doing the same work.
- Fork the repository and make your change on a branch.
- Open a pull request that references the issue number.
Research direction
Start with the chip_sw_alert_handler_ping_timeout test point in hw/top_earlgrey/data/ip/chip_alert_handler_testplan.hjson and inspect the existing device-side C test and Bazel rules referenced by the checklist. Determine the missing host-side component and verify it against the CW310 and Hyperdebug + CW310 targets. Done means the host-side component is implemented and the test passes in the relevant regression.
Written by the indexing model from the issue text.
Assessment
- Tech stack
- c
- Domain
- embedded-iot, testing
- Issue type
- Feature
- Difficulty
- 3/5
- Estimated time
- 1-2 days
- Activity status
- Stale
- Clarity
- Mostly clear
- Newbie friendliness
- 35/100