lowRISC / lowRISC/opentitan

[chip-test] chip_sw_usbdev_toggle_restore

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Component:ChipLevelTest Milestone:SV3 SiVal:TestRefactoring
Dominant language
SystemVerilog
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Forks
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Avg merge
2d 22h
Merged PRs (30d)
141

Description

### Test point name

chip_sw_usbdev_toggle_restore

NOTE: This is expected to fail on ES but is required for Prod; should be SV4.

### Host side component

None

### OpenTitanTool infrastructure implemented

None

### Silicon Validation (SiVal)

Yes

### Emulation Targets

- [ ] None
- [X] CW310
- [X] Hyperdebug + CW310

### Contact person

alees24

### Checklist

Please fill out this checklist as items are completed. Link to PRs and issues as appropriate.
- [ ] Check if existing test covers most or all of this testpoint (if so, either extend said test to cover all points, or skip the next 3 checkboxes)
- [ ] Device-side (C) component developed
- [ ] Bazel build rules developed
- [ ] Host-side component developed
- [ ] HJSON test plan updated with test name (so it shows up in the dashboard)
- [ ] Test added to dvsim nightly regression (and passing at time of checking)
- [ ] For SiVal test cases, test is running relevant FPGA or silicon regression

NOTE: This is expected to fail on ES but is required for Prod; should be SV4.

> estimate 1

Contributor guide

Open the contributing guide

First steps

  1. Read the whole issue, then the project's contributing guide.
  2. Comment on the issue to say you are picking it up — it saves two people doing the same work.
  3. Fork the repository and make your change on a branch.
  4. Open a pull request that references the issue number.

Research direction

Start with the chip_sw_usbdev_toggle_restore test point and review the checklist to determine which device-side, Bazel, test-plan, and regression pieces are missing. Confirm whether an existing test covers most of the test point, then verify completion through the relevant FPGA or silicon regression; the issue notes that it is required for Prod and expected to fail on ES.

Written by the indexing model from the issue text.

Assessment

Domain
embedded-iot, testing-qa
Issue type
Feature
Difficulty
4/5
Estimated time
3-5 days
Activity status
Stale
Clarity
Needs clarification
Newbie friendliness
20/100

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