[chip,dv] Full chip rand_reset test needs improvement
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Description
### Description
Generic template for {block}_*_with_rand_reset replies on inface based reset function
as in [here](https://cs.opensource.google/opentitan/opentitan/+/master:hw/dv/sv/cip_lib/seq_lib/cip_base_vseq.sv;drc=4d77215e28c6b62f0feb1af8ec692882fe8ddf1a;l=671)
This works well with block level but in full chip, test needs more improvement to mimic real chip behavior.
Currently `apply_resets_concurrently()` function drive por_n and all interface attached resets, which are inactive mostly.
To provide more stress, `apply_resets_concurrently()` function needs to do followings.
- Stop driving interface attached reset (including por_n)
- Trigger reset event using pre-configured alert handler
- Keep AON clock alive
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