Xilinx / Xilinx/embeddedsw

Randomized Data issue in xmt_main.c of zynqmp_dram_test

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Description

The newest version of the ZynqMP DRAM Test tool no longer generates randomized data properly. The previous version from 2017 worked correctly.

The issue stems from the function XMt_GetRefVal() where the XMT_RANDOM_VALUE() function is called at every test address. The call to XMT_RANDOM_VALUE() should be moved into the XMt_Memtest() function and called once before writing to the memory and again before verification.

In its current form the same value is written to every address, negating the purpose of the test. We noticed this when we were testing a bad memory device and we saw a difference in results between the 2017 code and the 2020 code.

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Research direction

Open xmt_main.c and trace XMt_GetRefVal() and XMt_Memtest(), focusing on each call to XMT_RANDOM_VALUE(). Move the calls as described so randomization occurs before the write phase and again before verification, then confirm the DRAM test no longer writes the same value to every address.

Written by the indexing model from the issue text.

Assessment

Tech stack
c
Domain
embedded-iot
Issue type
Bug
Difficulty
2/5
Estimated time
1-3 hours
Activity status
Stale
Clarity
Clearly specified
Newbie friendliness
58/100

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