ARMmbed / ARMmbed/ci-test-shield
DELTA_DFCM_NNN50 can not bypass pins A4, A5 in AnalogIn test case
Open
- Dominant language
- C++
- Stars
- 9
- Forks
- 33
- PR merge metrics
- No merged PRs in 30d
Description
Currently, pins A4 and A5 of DELTA_DFCM_NNN50 are used for external RC circuit.
While doing CI test, AnalogIn.cpp test throughout A0 to A5 by default result in ERROR on DELTA_DFCM_NNN50
Could you create a option said AIN_4_OUT and AIN_5_OUT in order to override in mbed_app.json?
Contributor guide
No contributing guide indexed for this repository
Research direction
Start with the AnalogIn.cpp CI test and the DELTA_DFCM_NNN50 configuration in mbed_app.json. Trace how A0 through A5 are selected, then verify that AIN_4_OUT and AIN_5_OUT can override the A4 and A5 behavior and prevent the external RC circuit from causing test errors.
Written by the indexing model from the issue text.
Assessment
- Tech stack
- cpp
- Domain
- embedded-iot, testing
- Issue type
- Feature
- Difficulty
- 3/5
- Estimated time
- 1-2 days
- Activity status
- Stale
- Clarity
- Mostly clear
- Newbie friendliness
- 35/100